A Rigorous Temperature-Dependent Stochastic Modelling and Testing for MEMS-Based Inertial Sensor Errors

Author: El-Diasty Mohammed   Pagiatakis Spiros  

Publisher: MDPI

E-ISSN: 1424-8220|9|11|8473-8489

ISSN: 1424-8220

Source: Sensors, Vol.9, Iss.11, 2009-10, pp. : 8473-8489

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Abstract