Accurate Permittivity Measurements for Microwave Imaging via Ultra-Wideband Removal of Spurious Reflectors

Author: Pelletier Mathew G.   Viera Joseph A.   Wanjura John   Holt Greg  

Publisher: MDPI

E-ISSN: 1424-8220|10|9|8491-8503

ISSN: 1424-8220

Source: Sensors, Vol.10, Iss.9, 2010-09, pp. : 8491-8503

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Abstract