Author: Chai Soo-See Walker Jeffrey P. Makarynskyy Oleg Kuhn Michael Veenendaal Bert West Geoff
Publisher: MDPI
E-ISSN: 2072-4292|2|1|166-190
ISSN: 2072-4292
Source: Remote Sensing, Vol.2, Iss.1, 2009-12, pp. : 166-190
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