Characterization of Doped Amorphous Silicon Thin Films through the Investigation of Dopant Elements by Glow Discharge Spectrometry. A Correlation of Conductivity and Bandgap Energy Measurements

Author： Sánchez Pascal   Lorenzo Olaya   Menéndez Armando   Menéndez Jose Luis   Gomez David   Pereiro Rosario   Fernández Beatriz  

Publisher： MDPI

E-ISSN： 1422-0067|12|4|2200-2215

ISSN： 1422-0067

Source： International Journal of Molecular Sciences, Vol.12, Iss.4, 2011-03, pp. : 2200-2215

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