Full-Field Strain Mapping at a Ge/Si Heterostructure Interface

Author: Li Jijun   Zhao Chunwang   Xing Yongming   Su Shaojian   Cheng Buwen  

Publisher: MDPI

E-ISSN: 1996-1944|6|6|2130-2142

ISSN: 1996-1944

Source: Materials, Vol.6, Iss.6, 2013-05, pp. : 2130-2142

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content