Symmetry Aspects of Dislocation-Effected Crystal Properties: Material Strength Levels and X-ray Topographic Imaging

Author: Armstrong Ronald W.  

Publisher: MDPI

E-ISSN: 2073-8994|6|1|148-163

ISSN: 2073-8994

Source: Symmetry, Vol.6, Iss.1, 2014-03, pp. : 148-163

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Abstract