A Two-Step A/D Conversion and Column Self-Calibration Technique for Low Noise CMOS Image Sensors

Author： Bae Jaeyoung Kim Daeyun Ham Seokheon Chae Youngcheol Song Minkyu

Publisher： MDPI

E-ISSN： 1424-8220|14|7|11825-11843

ISSN： 1424-8220

Source： Sensors, Vol.14, Iss.7, 2014-07, pp. : 11825-11843

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