A Non-Intrusive Method for Monitoring the Degradation of MOSFETs

Author： Wu Li-Feng Zheng Yu Guan Yong Wang Guo-Hui Li Xiao-Juan

Publisher： MDPI

E-ISSN： 1424-8220|14|1|1132-1139

ISSN： 1424-8220

Source： Sensors, Vol.14, Iss.1, 2014-01, pp. : 1132-1139

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