Using Ridge Regression Models to Estimate Grain Yield from Field Spectral Data in Bread Wheat (Triticum Aestivum L.) Grown under Three Water Regimes

Author: Hernandez Javier   Lobos Gustavo A.   Matus Iván   del Pozo Alejandro   Silva Paola   Galleguillos Mauricio  

Publisher: MDPI

E-ISSN: 2072-4292|7|2|2109-2126

ISSN: 2072-4292

Source: Remote Sensing, Vol.7, Iss.2, 2015-02, pp. : 2109-2126

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