Electrical Reliability of a Film-Type Connection during Bending

Author: Mitsui Ryosuke   Sato Junya   Takahashi Seiya   Nakajima Shin-ichiro  

Publisher: MDPI

E-ISSN: 2079-9292|4|4|827-846

ISSN: 2079-9292

Source: Electronics, Vol.4, Iss.4, 2015-10, pp. : 827-846

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Abstract