The Potential of Pan-Sharpened EnMAP Data for the Assessment of Wheat LAI

Author： Siegmann Bastian   Jarmer Thomas   Beyer Florian   Ehlers Manfred  

Publisher： MDPI

E-ISSN： 2072-4292|7|10|12737-12762

ISSN： 2072-4292

Source： Remote Sensing, Vol.7, Iss.10, 2015-09, pp. : 12737-12762

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