Toward a Faster Screening of Faulty Digital Chips via Current-Bound Estimation Based on Device Size and Threshold Voltage

Author： Cheng Ching-Hwa

Publisher： MDPI

E-ISSN： 2079-9268|6|2|6-6

ISSN： 2079-9268

Source： Journal of Low Power Electronics and Applications, Vol.6, Iss.2, 2016-05, pp. : 6-6

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