Power Pattern Sensitivity to Calibration Errors and Mutual Coupling in Linear Arrays through Circular Interval Arithmetics

Author： Anselmi Nicola   Salucci Marco   Rocca Paolo   Massa Andrea  

Publisher： MDPI

E-ISSN： 1424-8220|16|6|791-791

ISSN： 1424-8220

Source： Sensors, Vol.16, Iss.6, 2016-05, pp. : 791-791

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