A Semi-Analytical Extraction Method for Interface and Bulk Density of States in Metal Oxide Thin-Film Transistors

Author: Chen Weifeng   Wu Weijing   Zhou Lei   Xu Miao   Wang Lei   Ning Honglong   Peng Junbiao  

Publisher: MDPI

E-ISSN: 1996-1944|11|3|416-416

ISSN: 1996-1944

Source: Materials, Vol.11, Iss.3, 2018-03, pp. : 416-416

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Abstract