Evaluation of Apple Maturity with Two Types of Dielectric Probes

Author： Kafarski Marcin Wilczek Andrzej Szypłowska Agnieszka Lewandowski Arkadiusz Pieczywek Piotr Janik Grzegorz Skierucha Wojciech

Publisher： MDPI

E-ISSN： 1424-8220|18|1|121-121

ISSN： 1424-8220

Source： Sensors, Vol.18, Iss.1, 2018-01, pp. : 121-121

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