A Reliable Methodology for Determining Seed Viability by Using Hyperspectral Data from Two Sides of Wheat Seeds

Author： Zhang Tingting Wei Wensong Zhao Bin Wang Ranran Li Mingliu Yang Liming Wang Jianhua Sun Qun

Publisher： MDPI

E-ISSN： 1424-8220|18|3|813-813

ISSN： 1424-8220

Source： Sensors, Vol.18, Iss.3, 2018-03, pp. : 813-813

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