Author： Diouf Babacar Geoffroy Sandrine Chakra Ariane Abou Prat Marc
Publisher： Edp Sciences
E-ISSN： 1286-0050|81|1|11102-11102
ISSN： 1286-0042
Source： EPJ Applied Physics (The), Vol.81, Iss.1, 2018-04, pp. : 11102-11102
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Access to resources
Recommend
Doping profile measurement on textured silicon surface
By Essa Zahi
EPJ Photovoltaics, Vol. 9, Iss. issue, 2018-04 ,pp. :
Modeling of Fine Migration in a Porous Medium
By Galaguz Yuri
MATEC Web of conference, Vol. 86, Iss. issue, 2016-11 ,pp. :
Calculation of the particles transfer in a porous medium
MATEC Web of conference, Vol. 117, Iss. issue, 2017-07 ,pp. :
Calculation of the filtration in a heterogeneous porous medium
MATEC Web of conference, Vol. 117, Iss. issue, 2017-07 ,pp. :