Plasma-laser ion discrimination by TOF technique applied to coupled SiC detectors.

Publisher: Edp Sciences

E-ISSN: 2100-014x|167|issue|04003-04003

ISSN: 2100-014x

Source: EPJ Web of Conference, Vol.167, Iss.issue, 2018-01, pp. : 04003-04003

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract