Radiation Tolerant, Low Noise Phase Locked Loops in 65 nm CMOS Technology

Publisher： Edp Sciences

E-ISSN： 2100-014x|170|issue|01021-01021

ISSN： 2100-014x

Source： EPJ Web of Conference, Vol.170, Iss.issue, 2018-04, pp. : 01021-01021

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