Application of the E – Layer Model for Solving the Problems of Parametric Estimation in Measuring Devices

Publisher: Edp Sciences

E-ISSN: 2261-236x|155|issue|01020-01020

ISSN: 2261-236x

Source: MATEC Web of conference, Vol.155, Iss.issue, 2018-02, pp. : 01020-01020

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Abstract