Electrical Characterization of Integrated 2-Input TTL NAND Gate at Elevated Temperature, Fabricated in Bipolar SiС-Technology

Publisher: Trans Tech Publications

E-ISSN: 1662-9752|2018|924|958-961

ISSN: 0255-5476

Source: Materials Science Forum, Vol.2018, Iss.924, 2018-07, pp. : 958-961

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Abstract