Influence of Al Doping Concentration and Annealing Parameters on TiAl Based Ohmic Contacts on 4H-SiC

Publisher: Trans Tech Publications

E-ISSN: 1662-9752|2018|924|393-396

ISSN: 0255-5476

Source: Materials Science Forum, Vol.2018, Iss.924, 2018-07, pp. : 393-396

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Abstract