A statistical analysis of two-dimensional patterns and its application to astrometry

Author: Zavada Petr   Píška Karel  

Publisher: Edp Sciences

E-ISSN: 1432-0746|614|issue|A137-A137

ISSN: 0004-6361

Source: Astronomy & Astrophysics, Vol.614, Iss.issue, 2018-06, pp. : A137-A137

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Abstract