Publisher: Edp Sciences
E-ISSN: 2261-236x|173|issue|02044-02044
ISSN: 2261-236x
Source: MATEC Web of conference, Vol.173, Iss.issue, 2018-06, pp. : 02044-02044
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
MATEC Web of conference, Vol. 210, Iss. issue, 2018-10 ,pp. :
Study on Machine Learning Based Intelligent Defect Detection System
MATEC Web of conference, Vol. 201, Iss. issue, 2018-09 ,pp. :
Application of Extreme Learning Machine in GPS Positioning Process
MATEC Web of conference, Vol. 176, Iss. issue, 2018-07 ,pp. :