Picosecond Photoacoustic Metrology of SiO2 and LiNbO3 Layer Systems Used for High Frequency Surface-Acoustic-Wave Filters

Author： Brick Delia   Emre Erkan   Grossmann Martin   Dekorsy Thomas   Hettich Mike  

Publisher： MDPI

E-ISSN： 2076-3417|7|8|822-822

ISSN： 2076-3417

Source： Applied Sciences, Vol.7, Iss.8, 2017-08, pp. : 822-822

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