Uncertainty of the X-ray Diffraction (XRD) sin2 ψ Technique in Measuring Residual Stresses of Physical Vapor Deposition (PVD) Hard Coatings

Author： Luo Quanshun   Yang Shicai  

Publisher： MDPI

E-ISSN： 2079-6412|7|8|128-128

ISSN： 2079-6412

Source： Coatings, Vol.7, Iss.8, 2017-08, pp. : 128-128

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