The Meaning and Measure of Vertical Resolution in Optical Surface Topography Measurement

Author: de Groot Peter J.  

Publisher: MDPI

E-ISSN: 2076-3417|7|1|54-54

ISSN: 2076-3417

Source: Applied Sciences, Vol.7, Iss.1, 2017-01, pp. : 54-54

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract