A Bayesian Optimal Design for Sequential Accelerated Degradation Testing

Author: Li Xiaoyang   Hu Yuqing   Sun Fuqiang   Kang Rui  

Publisher: MDPI

E-ISSN: 1099-4300|19|7|325-325

ISSN: 1099-4300

Source: Entropy, Vol.19, Iss.7, 2017-07, pp. : 325-325

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Abstract