Mapping Quantitative Trait Loci (QTL) for Resistance to Late Blight in Tomato

Author: Panthee Dilip R.   Piotrowski Ann   Ibrahem Ragy  

Publisher: MDPI

E-ISSN: 1422-0067|18|7|1589-1589

ISSN: 1422-0067

Source: International Journal of Molecular Sciences, Vol.18, Iss.7, 2017-07, pp. : 1589-1589

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content