Bias Stress and Temperature Impact on InGaZnO TFTs and Circuits

Author: Martins Jorge   Bahubalindruni Pydi   Rovisco Ana   Kiazadeh Asal   Martins Rodrigo   Fortunato Elvira   Barquinha Pedro  

Publisher: MDPI

E-ISSN: 1996-1944|10|6|680-680

ISSN: 1996-1944

Source: Materials, Vol.10, Iss.6, 2017-06, pp. : 680-680

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract