Analysis of Anti-JFET for 600V VDMOS and HCI Reliability

Author: Yang Shao-Ming  

Publisher: Edp Sciences

E-ISSN: 2261-236x|201|issue|05001-05001

ISSN: 2261-236x

Source: MATEC Web of conference, Vol.201, Iss.issue, 2018-09, pp. : 05001-05001

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Abstract