Analysis of Repairable k-out-of-n System Model Using Inter-Arrival Failure Times

Publisher： Edp Sciences

E-ISSN： 2271-2097|22|issue|01054-01054

ISSN： 2271-2097

Source： ITM Web of conferences, Vol.22, Iss.issue, 2018-10, pp. : 01054-01054

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