Publisher: IOP Publishing
E-ISSN: 1361-6463|48|1|15305-15310
ISSN: 0022-3727
Source: Journal of Physics D: Applied Physics, Vol.48, Iss.1, 2015-01, pp. : 15305-15310
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Characterization of roughness correlations in W/Si multilayers by diffuse x-ray scattering
Le Journal de Physique IV, Vol. 04, Iss. C9, 1994-11 ,pp. :
Hard X-ray one dimensional nano-focusing at the SSRF using a WSi 2 /Si multilayer Laue lens
By Qiu-Shi Huang Hao-Chuan Li Zhu-Qing Song Jing-Tao Zhu Zhan-Shan Wang Ai-Guo Li Shuai Yan Cheng-Wen Mao Hua Wang Fen Yan Ling Zhang Xiao-Han Yu Peng Liu Ming Li
Chinese Physics C, Vol. 37, Iss. 2, 2013-02 ,pp. :
Interface characterization of SrTiO3/Sr/Si heterostructure through X-ray reflectivity
Journal of Physics: Conference Series , Vol. 152, Iss. 1, 2009-03 ,pp. :
X-ray photoelectron study of Si+ ion implanted polymers
Journal of Physics: Conference Series , Vol. 253, Iss. 1, 2010-11 ,pp. :