In situ x-ray reflectivity study of swift heavy ion induced interface modification in a W/Si multilayer x-ray mirror

Publisher: IOP Publishing

E-ISSN: 1361-6463|48|1|15305-15310

ISSN: 0022-3727

Source: Journal of Physics D: Applied Physics, Vol.48, Iss.1, 2015-01, pp. : 15305-15310

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Abstract