Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.35, Iss.11, 2014-11, pp. : 115011-115017
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Inductance Modeling for On-Chip Interconnects
By Tu S-W.
Analog Integrated Circuits and Signal Processing, Vol. 35, Iss. 1, 2003-04 ,pp. :
On-Chip Clock Faults' Detector
By Metra C.
Journal of Electronic Testing, Vol. 18, Iss. 4-5, 2002-08 ,pp. :