Velocity profile of thin film flows measured using a confocal microscopy particle image velocimetry system with simultaneous multi depth position

Publisher: IOP Publishing

E-ISSN: 1361-6501|26|2|25301-25308

ISSN: 0957-0233

Source: Measurement Science and Technology, Vol.26, Iss.2, 2015-02, pp. : 25301-25308

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract