Modeling Local Item Dependence Due to Common Test Format With a Multidimensional Rasch Model

Author: Baghaei Purya   Aryadoust Vahid  

Publisher: Routledge Ltd

E-ISSN: 1532-7574|15|1|71-87

ISSN: 1530-5058

Source: International Journal of Testing, Vol.15, Iss.1, 2015-01, pp. : 71-87

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Abstract