Equivalent step-stress accelerated life tests with log-location-scale lifetime distributions under Type-I censoring

Author: Hu Cheng-Hung   Plante Robert D.   Tang Jen  

Publisher: Springer Publishing Company

E-ISSN: 1545-8830|47|3|245-257

ISSN: 0740-817X

Source: IIE Transactions, Vol.47, Iss.3, 2015-03, pp. : 245-257

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Abstract