Failure probability estimation with differently sized reference products for semiconductor burn‐in studies

Publisher: John Wiley & Sons Inc

E-ISSN: 1526-4025|31|5|732-744

ISSN: 1524-1904

Source: APPLIED STOCHASTIC MODELS IN BUSINESS AND INDUSTRY, Vol.31, Iss.5, 2015-09, pp. : 732-744

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Abstract