Ionic screening effect on low-frequency drain current fluctuations in liquid-gated nanowire FETs

Publisher: IOP Publishing

E-ISSN: 1361-6528|26|49|495501-495506

ISSN: 0957-4484

Source: Nanotechnology, Vol.26, Iss.49, 2015-12, pp. : 495501-495506

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract