Interstitial oxygen related defects and nanovoids in Au implanted a-SiO2 glass depth profiled by positron annihilation spectroscopy

Publisher： IOP Publishing

E-ISSN： 1361-6463|48|49|495302-495312

ISSN： 0022-3727

Source： Journal of Physics D: Applied Physics, Vol.48, Iss.49, 2015-12, pp. : 495302-495312

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