Effects of crystal orientation on electronic band structure and anomalous shift of higher critical point in VO2 thin films during the phase transition process

Publisher: IOP Publishing

E-ISSN: 1361-6463|48|48|485302-485311

ISSN: 0022-3727

Source: Journal of Physics D: Applied Physics, Vol.48, Iss.48, 2015-12, pp. : 485302-485311

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Abstract