Electrical Instability Induced by Electron Trapping in Low‐Bandgap Donor–Acceptor Polymer Field‐Effect Transistors

Publisher： John Wiley & Sons Inc

E-ISSN： 1521-4095|27|43|7004-7009

ISSN： 0935-9648

Source： ADVANCED MATERIALS, Vol.27, Iss.43, 2015-11, pp. : 7004-7009

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