Study on statistically similar RVEs for real microstructures based on different statistical descriptors

Publisher: John Wiley & Sons Inc

E-ISSN: 1617-7061|15|1|467-468

ISSN: 1617-7061

Source: PROCEEDINGS IN APPLIED MATHEMATICS & MECHANICS (ELECTRONIC), Vol.15, Iss.1, 2015-10, pp. : 467-468

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Abstract