In Situ Monitoring of Pit Nucleation and Growth at an Iron Passive Oxide Layer by using Combined Atomic Force and Scanning Electrochemical Microscopy

Publisher: John Wiley & Sons Inc

E-ISSN: 2196-0216|2|11|1847-1856

ISSN: 2196-0216

Source: CHEMELECTROCHEM (ELECTRONIC), Vol.2, Iss.11, 2015-11, pp. : 1847-1856

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Abstract