XPS and AFM studies of surface chemistry and morphology of In2O3 ultrathin films deposited by rheotaxial growth and vacuum oxidation after air exposure

Publisher： John Wiley & Sons Inc

E-ISSN： 1521-4079|50|11|884-890

ISSN： 0232-1300

Source： CRYSTAL RESEARCH AND TECHNOLOGY (ELECTRONIC), Vol.50, Iss.11, 2015-11, pp. : 884-890

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