Topographic characterization of unworn contact lenses assessed by atomic force microscopy and wavelet transform

Publisher: John Wiley & Sons Inc

E-ISSN: 1097-0029|78|11|1026-1031

ISSN: 1059-910x

Source: MICROSCOPY RESEARCH AND TECHNIQUE, Vol.78, Iss.11, 2015-11, pp. : 1026-1031

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract