Electrical properties and microstructural characterization of Ni/Ta contacts to n-type 6H–SiC

Author: Tian-Yu Zhou   Xue-Chao Liu   Wei Huang   Shi-Yi Zhuo   Yan-Qing Zheng   Er-Wei Shi  

Publisher: IOP Publishing

E-ISSN: 1741-4199|24|12|126801-126805

ISSN: 1674-1056

Source: Chinese Physics B, Vol.24, Iss.12, 2015-12, pp. : 126801-126805

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract