A Cross-Sectional TEM Specimen of a Multilayer Thin Film Prepared Using the FIB Technique

Publisher: Trans Tech Publications

E-ISSN: 1662-7482|2015|771|108-111

ISSN: 1660-9336

Source: Applied Mechanics and Materials, Vol.2015, Iss.771, 2015-08, pp. : 108-111

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Abstract