A Built-In Test Circuit for Detecting Open Defects by IDDT Appearance Time in CMOS ICs

Publisher: Trans Tech Publications

E-ISSN: 1662-7482|2015|761|202-207

ISSN: 1660-9336

Source: Applied Mechanics and Materials, Vol.2015, Iss.761, 2015-06, pp. : 202-207

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Abstract