In situ CTE measurements and damage detection using optical metrology

Author: Rajaram Satish   Cuadra Jefferson   Saralaya Raghav   Bartoli Ivan   Kontsos Antonios  

Publisher: IOP Publishing

E-ISSN: 1361-6501|27|2|25202-25210

ISSN: 0957-0233

Source: Measurement Science and Technology, Vol.27, Iss.2, 2016-02, pp. : 25202-25210

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Abstract